Determination of thicknesses and impurities of targets by measuring backscattered particles from 2 MeV 4He+-bombardment-Reference-Cited by-同舟云学术

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Determination of thicknesses and impurities of targets by measuring backscattered particles from 2 MeV 4He+-bombardment

Published:1985-06 Issue:3 Volume:236 Page:627-629
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Guoji Xu,Yuhua Zhao,Shengnan Zheng,Yongchang Xu

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference3 articles.

1. Thin film thickness determination by alpha particle backscattering

2. Backscattering Spectrometry,1978

3. Backscattering Spectrometry,1978

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A track technique for the measurement of target thickness using heavy ions;Radiation Measurements;1995-04

2. Fission foil characteristics;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1989-10

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