Wide band-pass approaches to total-reflection X-ray fluorescence using synchrotron radiation-Reference-Cited by-同舟云学术

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Wide band-pass approaches to total-reflection X-ray fluorescence using synchrotron radiation

Published:1994-08 Issue:1-3 Volume:347 Page:417-421
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Brennan S.,Tompkins W.,Takaura N.,Pianetta P.,Laderman S.S.,Fischer-Colbrie A.,Kortright J.B.,Madden M.C.,Wherry D.C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. Proc. Workshop on Applications of Synchrotron Radiation to Trace Impurity Analysis for Advanced Silicon Processing;Laderman,1992

2. Principles and Practice of X-ray Spectrometric Analysis;Bertin,1975

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2. Synchrotron radiation-induced total reflection X-ray fluorescence analysis;TrAC Trends in Analytical Chemistry;2010-06

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4. Potential application of doubly curved crystal optics;SPIE Proceedings;2004-11-03

5. Synchrotron Radiation;digital Encyclopedia of Applied Physics;2003-04-15

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