TXRF with synchrotron radiation Analysis of Ni on Si-wafer surfaces
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference9 articles.
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2. Total-Reflection X-Ray Fluorescence (TXRF) Analysis;Surface and Thin Film Analysis;2011-04-12
3. Iron speciation in human cancer cells by K-edge total reflection X-ray fluorescence–X-ray absorption near edge structure analysis;Spectrochimica Acta Part B: Atomic Spectroscopy;2011-03
4. Research and Development of X-Ray Spectroscopy Based on Polycapillary Optics at Laboratori Nazionali di Frascati;AIP Conference Proceedings;2010
5. Feasibility study of SR-TXRF-XANES analysis for iron contaminations on a silicon wafer surface;Surface and Interface Analysis;2008-12
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