X-e− coincidence Mössbauer scattering experiment-Reference-Cited by-同舟云学术

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X-e− coincidence Mössbauer scattering experiment

Published:1985-08 Issue:2-3 Volume:238 Page:469-472
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Bara J.J.,Bogacz B.F.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. Method of analysis of thin surface layers by the Mössbauer effect

2. Depth selective Mössbauer-effect measurements by means of scattered electrons

3. An electrostatic spectrometer for conversion electron Mössbauer spectroscopy

4. Analysis of the electron transport in conversion electron Mössbauer spectroscopy (CEMS)

5. On the interpretation and practical analysis of depth selective conversion electron Mössbauer spectra

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Conversion Electron Mössbauer Spectroscopy;Mössbauer Spectroscopy in Materials Science;1999

2. Applications of conversion electron Mössbauer spectrometry (CEMS);Journal of Radioanalytical and Nuclear Chemistry Articles;1996-01

3. Angle sensitive and depth selective CEMS spectra;Hyperfine Interactions;1990-07

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