Coincidence-summing corrections for extended sources in gamma-ray spectrometry using Monte Carlo simulation
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference14 articles.
1. Gamma- and X-Ray spectrometry with Semiconductor Detectors;Debertin,1988
2. Influence of source-detector distance on relative intensity and angular correlation measurements with Ge(Li) spectrometers
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