Author:
Borer K.,Clark A.G.,Gildemeister O.,Gössling C.,Heijne E.H.M.,Jarron P.,Lisowski B.,Pal T.,Parker M.A.,Redaelli N.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference11 articles.
1. 6th Int. Conf. on pp Physics;Booth,1986
2. Micron Semiconductor Limited, Lancing, England.
3. Reliability Studies of Planar Silicon Detectors
Cited by
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