A VXI-based high speed X-ray CCD detector
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference9 articles.
1. Synchrotron X-Ray Diffraction Study of Silicon during Pulsed-Laser Annealing
2. Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator
3. Performance of a hard x‐ray undulator at CHESS (invited)
4. X‐ray microtomography with monochromatic synchrotron radiation (invited)
5. Real-time x-ray studies of strain kinetics inInxGa1−xAs quantum-well structures
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1. Application of a CCD-based X-ray diffractometerto polymer fibre diffraction;Polymer;1998
2. Time‐resolved x‐ray scattering program at the Advanced Photon Source;Review of Scientific Instruments;1995-02
3. Atomic Spectrometry Updates—References;J. Anal. At. Spectrom.;1995
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