Focussing of synchroton radiation X-ray beams using synthetic multilayer mirrors

Author:

Thompson A.C.,Wu Y.,Underwood J.H.,Barbee T.W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. Workshop on Instrumentation for Synchrotron Radiation Research;Barbee,1978

2. Topical Conf. on Low-Energy X-ray Diagnostics;Spiller,1981

3. Trace element determination using synchrotron radiation

4. Formation of Optical Images by X-Rays

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1. Characterization of Geological Materials Using Ion and Photon Beams;Nuclear Methods in Mineralogy and Geology;1998

2. Chapter 3 Microbeam and chemical state analysis;Analytical Spectroscopy Library;1996

3. A comparison between the use of MeV ion beams and synchrotron radiation for element analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-04

4. Kirkpatrick–Baez microscope based on a Bragg–Fresnel x-ray multilayer focusing system;Applied Optics;1992-11-01

5. Focussing optics for a synchrotron-based X-ray microprobe;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1992-08

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