Characterization of ground-based and space-based mercuric iodide single crystals by means of X-ray topography and diffractometry-Reference-Cited by-同舟云学术

Characterization of ground-based and space-based mercuric iodide single crystals by means of X-ray topography and diffractometry

Published:1989-12 Issue:3 Volume:285 Page:513-519
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Leon-Gits S.,Fries E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. Plastic defects in α-HgI2 single crystals

2. Characterization of extended defects in α-HgI2 single crystals

3. Applications of X-ray Topographic Methods to Materials Science;Gits,1984

4. Characterization of Crystal Growth Defects by X-ray Methods;Amstrong,1980

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