An XRF method for the determination of the efficiency of Si(Li) detectors in an extended-source geometry by using thick specimens
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference10 articles.
1. Accurate efficiency calibration and properties of semiconductor detectors for low-energy photons
2. An inter-comparison of efficiency-calibration techniques for semiconductor X-ray detectors
3. Efficiency calibration of a Si(Li) detector at photon energies below 5 keV
4. A radially dependent photopeak efficiency model for Si(Li) detectors
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Applicability of annular-source excited systems in quantitative XRF analysis;X-Ray Spectrometry;1994-03
2. Experimental L-Shell X-Ray Production and Ionization Cross Sections for Proton Impact;Atomic Data and Nuclear Data Tables;1994-01
3. Measurement of relative intensities of L-shell x-rays of some heavy elements using Cd-109 radioisotope source;X-Ray Spectrometry;1992-05
4. Comparison of experimental relative efficiencies for different Si(Li) detectors in the energy range, 4.5-17.5 keV;X-Ray Spectrometry;1987-03
5. Calibration of the Radioisotope-Excited X-Ray Spectrometer with Thick Standards;Applied Spectroscopy;1987-01
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