On the necessity of alternative methods to determine sample thicknesses and masses

Author:

Wagemans Cyriel

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. Report EUR7985 EN;Pauwels,1982

2. Thin 33S layers for 33S(n, α) cross-section measurements

3. F. Verheyen, private communication.

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