Characterization tests on layered synthetic microstructures as X-ray optical elements-Reference-Cited by-同舟云学术

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Characterization tests on layered synthetic microstructures as X-ray optical elements

Published:1990-05 Issue:1-2 Volume:291 Page:265-271
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Warburton W.K.,Barbee T.W.,Rek Zofia U.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference29 articles.

1. High Resolution Soft X-ray Optics;Lovas,1981

2. X-ray microprobe using multilayer mirrors

3. High Resolution Soft X-ray Optics;Catura,1981

4. High Resolution Soft X-ray Optics;Underwood;Proc. SPIE,1981

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Properties of laser‐sputtered Ti/Be multilayers;Review of Scientific Instruments;1992-01

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