Asymmetric topography of silicon in Laue and Bragg geometries at the SRS-Reference-Cited by-同舟云学术

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Asymmetric topography of silicon in Laue and Bragg geometries at the SRS

Published:1987-11 Issue:1-2 Volume:261 Page:260-262
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Clark G.F.,Panchenko V.E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference22 articles.

1. New X‐Ray Topographic Technique for Detection of Small Defects in Highly Perfect Crystals

2. Topographic observation of micro defects (e.g.`swirls') in nearly perfect crystals

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray topography on the VEPP-3 and VEPP-4 SR beams and X-ray imaging techniques;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1987-11

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