3.1 GeV-xenon ion latent tracks in Bi2Fe4O9: High-resolution electron microscope observations-Reference-Cited by-同舟云学术

3.1 GeV-xenon ion latent tracks in Bi2Fe4O9: High-resolution electron microscope observations

Published:1988-10 Issue:2 Volume:76 Page:260-265
ISSN:0022-4596
Container-title:Journal of Solid State Chemistry
language:en
Short-container-title:Journal of Solid State Chemistry

Author:

Groult D.,Hervieu M.,Nguyen N.,Raveau B.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Physical and Theoretical Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference25 articles.

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5. Application of lattice imagery to radiation damage investigation in natural zircon

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