Anodic oxide thickness on aluminum
Author:
Publisher
Elsevier BV
Subject
General Materials Science,General Chemical Engineering,General Chemistry
Reference3 articles.
1. Ellipsometry in measurements of surfaces and thin films;McCrackin,1963
2. Effects of vacuum deposition conditions on ellipsometric parameters, optical constants, and reflectance of ultrapure aluminum films
3. Ellipsometry Using a Retardation Plate as Compensator*
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