Scanning Auger microscopy as applied to the analysis of highly textured YBaCu3Ox thin films-Reference-Cited by-同舟云学术

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Scanning Auger microscopy as applied to the analysis of highly textured YBaCu3Ox thin films

Published:1989-05 Issue: Volume:151 Page:23-29
ISSN:0022-5088
Container-title:Journal of the Less Common Metals
language:en
Short-container-title:Journal of the Less Common Metals

Author:

Keim Enrico G.,Halbritter Jürgen,Häuser Bernd,Rogalla Horst

Publisher

Elsevier BV

Subject

General Engineering

Reference10 articles.

1. Proc. ASC Conf.;Halbritter,1988

2. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy;Hofmann,1985

3. Novel Superconductivity;Häuser,1987

4. Detectability limits for Auger analysis,1984

5. ARXPS-studies ofcˆ-axis textured YBa2Cu3Ox-films

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Corrosion of superconductors-especially of YBa/sub 2/Cu/sub 3/O/sub 7-δ/ cuprate;IEEE Transactions on Appiled Superconductivity;1999-06

2. Studies of YBa2Cu3O7−x formation in coevaporated YBaF2CuO thin films on sapphire substrates;Thin Solid Films;1994-07

3. Thin Aluminum Oxide Films as Electrical Barriers Between Superconducting Y-Ba-Cu-O Layers;Advances in Cryogenic Engineering Materials;1990

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