Determination of solid surface tension from particle–substrate pull-off forces measured with the atomic force microscope-Reference-Cited by-同舟云学术

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Determination of solid surface tension from particle–substrate pull-off forces measured with the atomic force microscope

Published:2004-12 Issue:2 Volume:280 Page:484-497
ISSN:0021-9797
Container-title:Journal of Colloid and Interface Science
language:en
Short-container-title:Journal of Colloid and Interface Science

Author:

Drelich Jaroslaw,Tormoen Garth W.,Beach Elvin R.

Publisher

Elsevier BV

Subject

Colloid and Surface Chemistry,Surfaces, Coatings and Films,Biomaterials,Electronic, Optical and Magnetic Materials

Reference47 articles.

1. Interfacial Tensiometry;Rusanov,1996

2. Surface Characterization Methods: Principles, Techniques, and Applications;Butt,1999

3. Interfacial Forces in Aqueous Media;Van Oss,1994

4. Force-distance curves by atomic force microscopy

5. Scanning Force Microscopy;Sarid,1991

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