Elemental analysis using x- and prompt γ-rays induced by 4.7 MeV α particles
Author:
Publisher
Elsevier BV
Subject
General Engineering
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1. Analytical use of ion-induced X-rays
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1. Studies on modification of some first wall materials using 3–6.8 MeV He ions;Fusion Engineering and Design;2000-11
2. Surface damage on stainless steel, Ni, Cu and Mo under mev alpha particle irradiation–surface damage on stainless steel, Ni, Cu, Mo;Radiation Effects and Defects in Solids;1997-01
3. Simultaneous microanalysis of nitrogen and oxygen on silicon using NRA with a cyclotron;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
4. Nuclear Data for Geology and Mining;Nuclear Data for Science and Technology;1992
5. Determination of light elements using cyclotron-accelerated particles;Journal of Radioanalytical and Nuclear Chemistry Letters;1991-09
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