An automatic visual inspection system for integrated circuit chips-Reference-Cited by-同舟云学术

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An automatic visual inspection system for integrated circuit chips

Published:1980-12 Issue:4 Volume:14 Page:293-343
ISSN:0146-664X
Container-title:Computer Graphics and Image Processing
language:en
Short-container-title:Computer Graphics and Image Processing

Author:

Hsieh Y.Y,Fu K.S

Publisher

Elsevier BV

Subject

General Earth and Planetary Sciences,General Environmental Science

Reference41 articles.

1. Closed-circuit TV peeks into manufacturing;Hegland;Automation,1976

2. Introduction to Statistical Pattern Recognition;Fukunaga,1972

3. Pattern Recognition Principles;Tou,1974

4. Special issue on feature extraction and selection in pattern recognition,1971

5. Sequential Methods in Pattern Recognition and Machine Learning;Fu,1968

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mathematical morphology applied to integrated circuit inspection;Journal of Crystal Growth;1990-06

2. Knowledge-directed inspection for complex multilayered patterns;Machine Vision and Applications;1989-06

3. A feasibility study of ic chip wire bond inspection;Journal of Robotic Systems;1988-04

4. A line extraction method for automated SEM inspection of VLSI resist;IEEE Transactions on Pattern Analysis and Machine Intelligence;1988

5. An automatic wafer inspection system using pipelined image processing techniques;IEEE Transactions on Pattern Analysis and Machine Intelligence;1988

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