Intrinsic and extrinsic loss contributions in X-ray induced photo- and Auger electron emission from surface layers of solids

Author:

Gervasoni J.L.,Kövér L.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Electron Spectroscopy for Surface Analysis;Ibach,1977

2. Emission of convoy electrons after grazing ion-surface collisions

3. Low Energy Electron Spectrometry;Sevier,1972

4. Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence

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2. Effects of the electron–hole pair in Auger and X-ray photoemission spectroscopy from surfaces of Fe–Si;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-07

3. Angular broadening in core‐electron spectroscopy;Surface and Interface Analysis;2015-03-12

4. Electron emission near nanocylinders of Al;Journal of Physics: Conference Series;2009-11-01

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