High precision ray tracing in cylindrically symmetric electrostatics-Reference-Cited by-同舟云学术

High precision ray tracing in cylindrically symmetric electrostatics

Published:2015-11 Issue: Volume:205 Page:111-121
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Edwards Jr David

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Electrostatic Lens Systems;Heddle,2000

2. FDM for curved geometries in electrostatics II: the minimal algorithm;David,2014

3. Finite difference method for boundary value problems. Application: high precision electrostatics;David,2015

4. Accurate calculations of electrostatic potentials for cylindrically symmetric lenses;David;Rev. Sci. Instrum.,1983

5. High precision electrostatic potential calculations for cylindrically symmetric lenses;David;Rev. Sci. Instrum.,2007

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