Spatially resolved X-ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

Spatially resolved X-ray photoelectron spectroscopy

Published:2005-05 Issue:2-3 Volume:143 Page:241-249
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Blomfield Christopher J.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Surface Analysis—The Principal Techniques,1997

2. Practical Surface Analysis,1990

3. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy,2003

4. ESCA: Atomic, Molecular and Solid State Structure Studies by Means of Electron Spectroscopy;Siegbahn,1967

5. P.E. Larson, P.W. Palmberg, Scanning and high resolution electron spectroscopy and imaging, US Patent 5,444,242 (1985).

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