Maximum probing depth of low-energy photoelectrons in an amorphous organic semiconductor film-Reference-Cited by-同舟云学术

Maximum probing depth of low-energy photoelectrons in an amorphous organic semiconductor film

Published:2014-12 Issue: Volume:197 Page:17-21
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Ozawa Yusuke,Nakayama Yasuo,Machida Shin’ichi,Kinjo Hiroumi,Ishii Hisao

Funder

IMS

G-COE Program

JSPS KAKENHI

TEPCO Memorial Foundation

Yazaki Memorial Foundation for Science and Technology

Sasagawa Scientific Research Grant

Izumi Science and Technology Foundation

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. Reliability of Organic Field-Effect Transistors

2. Electronic structures at organic heterojunctions of N,N′-bis(1-naphthyl)-N,N′-diphenyl-1,1′-biphenyl-4,4′-diamin (NPB)-based organic light emitting diodes

3. Strongly reduced band gap in a correlated insulator in close proximity to a metal

4. Electronic polarization at surfaces and thin films of organic molecular crystals: PTCDA

5. Interface electronic structures of 2-amino-4,5-imidazoledicarbonitrile on Ag and Al surfaces

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