X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32-Reference-Cited by-同舟云学术

X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32

Published:2010-05 Issue: Volume:178-179 Page:258-267
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Zegenhagen Jörg,Detlefs Blanka,Lee Tien-Lin,Thiess Sebastian,Isern Helena,Petit Lucien,André Lionel,Roy Jérôme,Mi Yanyu,Joumard Isabelle

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference46 articles.

1. Detection of Foreign Atom Sites by Their X-Ray Fluorescence Scattering

2. Surface structure determination with X-ray standing waves

3. Preface to hard X-ray photo electron spectroscopy (HAXPES)

4. X-ray photoemission spectroscopy

5. Hard X-ray photoelectron spectroscopy: sensitivity to depth, chemistry and orbital character

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