Development of X-ray photoelectron microscope with a compact X-ray source generated by line-focused laser irradiation-Reference-Cited by-同舟云学术

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Development of X-ray photoelectron microscope with a compact X-ray source generated by line-focused laser irradiation

Published:2005-06 Issue: Volume:144-147 Page:1183-1186
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Yamaguchi N.,Takahashi Z.,Nishimura Y.,Watanabe K.,Okamoto Y.,Sakata A.,Azuma H.,Hara T.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Astigmatism correction in x‐ray scanning photoemission microscope with use of elliptical zone plate

2. High resolution spectromicroscopy with MAXIMUM: Photoemission spectroscopy reaches the 1000 Å scale

3. Spectromicroscopy beamline at ELETTRA: Performances achieved at the end of commissioning

4. SPELEEM: Combining LEEM and Spectroscopic Imaging

5. X-Ray Photoelectron Spectroscopy Using a Focused-Laser-Produced Plasma X-Ray Beam

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