1. Semiconductor Equipment Materials International (SEMI), Specification for semiconductor processing equipment voltage sag immunity, SEMI Standard F47-0706,2006
2. Testing and measurement techniques – voltage dips, short interruptions and voltage variations immunity tests, IEC 61000-4-11,2004
3. Testing and measurement techniques – voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase, IEC 61000-4-34,2005
4. Voltage characteristics of electricity supplied by public electricity networks, EN 50160, CENELEC,2010
5. Towards Voltage Quality regulation in Europe – An ERGEG Conclusions Paper, ERGEG,2007