Microstructural study on multilayer [FeTaN/TaN]5 films-Reference-Cited by-同舟云学术

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Microstructural study on multilayer [FeTaN/TaN]5 films

Published:2003-08 Issue:24-25 Volume:57 Page:3904-3909
ISSN:0167-577X
Container-title:Materials Letters
language:en
Short-container-title:Materials Letters

Author:

Zhan Qian,Yu Rong,He Lianlong,Li Douxing,Nie Hongbin,Ong Chongkim

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference20 articles.

1. Magnetic and structural properties of epitaxially grown FeTaN thin films

2. Comparison of mechanical and tribological properties of permalloy and high moment FeTaN thin films for tape recording heads

3. Effects of nitrogen content on the microstructure and magnetic properties of FeTaN films

4. Magnetic properties and crystal structure of high moment FeTaN materials for thin‐film recording heads

5. FeN phase generation effects for high moment FeTaN films

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. AuNx stabilization with interstitial nitrogen atoms: A Density Functional Theory Study;Journal of Physics: Conference Series;2017-06

2. Tantalum nitride nanowires: Synthesis and characterization;Materials Letters;2014-12

3. Structural stability, elastic constants, bonding characteristics and thermal properties of zincblende, rocksalt and fluorite phases in copper nitrides: plane-wave pseudo-potential ab initio calculations;Open Physics;2011-01-01

4. Electrical properties of AuN thin films;Physica Scripta;2008-10

5. Investigation of structural stability and electronic properties of CuN, AgN and AuN by first principles calculations;Physics Letters A;2007-02

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