Elimination of parasitic reflections for objects with high transparency in phase measuring deflectometry-Reference-Cited by-同舟云学术

Elimination of parasitic reflections for objects with high transparency in phase measuring deflectometry

Author:

Siwei Tao,Huimin Yue,Hongli Chen,Tianhe Wang,Jiawei Cai,Yuxiang Wu,yong Liu

Funder

National Nature Science Foundation of China

Sichuan Science and Technology Project

Fundamental Research Funds for the Central Universities of Ministry of Education of China

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference23 articles.

1. Phase measuring deflectometry: a new approach to measure specular free-form surfaces;Knauer;Proc SPIE Opt Metrol Prod Eng,2004

2. Deflectometry vs. Interferometry;Häusler;Proc SPIE Opt Metrol,2013

3. UV-Deflectometry: no parasitic reflections;Sprenger,2010

4. Deflectometry challenges interferometry – the competition gets tougher!;Faber;Proc SPIE Int Soc,2012

5. Deflectometric measurement of large mirrors;Olesch;Adv Opt Technol,2014

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