Measurement of the optical dielectric properties of thin-film materials by ultrafast time-resolved interferometry-Reference-Cited by-同舟云学术

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Measurement of the optical dielectric properties of thin-film materials by ultrafast time-resolved interferometry

Published:2020-03 Issue: Volume:16 Page:102958
ISSN:2211-3797
Container-title:Results in Physics
language:en
Short-container-title:Results in Physics

Author:

Song Hai-Ying,Wang Peng,Ge Qi-Ni,Li Ya-Chao,Emara Elshaimaa M.,Lu Mei-Rong,Liu Shi-Bing

Funder

National Natural Science Foundation of China

Beijing Education Commission

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference32 articles.

1. Denisyuk I, Fokina M. A review of high nanoparticles concentration composites: semiconductor and high refractive index materials, in nanocrystals, Y. Masuda, ed. Chap. 5 (Sciyo, 2010).

2. Preparation and characterization of ZnS-polymer nanocomposite films with high refractive index;Lu;J Mater Chem,2003

3. Fabrication of transparent Pu/Zro2 nanocomposite coatings with high refractive index;Xu;Chin J Polym Sci,2010

4. Tailoring the refractive index of nanoimprint resist by blending with TiO2 nanoparticles;Pradana;Opt Mater Express,2014

5. A novel preparation of high-refractive-index and highly transparent polymer nanohybrid composites;Cai;Appl Phys Express,2011

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1. Probability of orbital angular momentum for square Hermite–Gaussian vortex pulsed beam in oceanic turbulence channel;Results in Physics;2021-09

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