Structural and electrical properties of Al100−X Mgx/Si(1 1 1) thin films-Reference-Cited by-同舟云学术

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Structural and electrical properties of Al100−X Mgx/Si(1 1 1) thin films

Published:2019-09 Issue: Volume:14 Page:102417
ISSN:2211-3797
Container-title:Results in Physics
language:en
Short-container-title:Results in Physics

Author:

Chihi T.,Fatmi M.,Barka B.,Ahmed S.I.,Sahnoune F.

Publisher

Elsevier BV

Subject

General Physics and Astronomy

Reference15 articles.

1. Industrial development of non-heat treatable aluminum alloys;Sanders;Mater Forum,2004

2. SSC-4 effect of welded properties on aluminum structures;Sensharma,2010

3. Strain rate sensitivity of the commercial aluminum alloy AA5182-O;Picu;Mater Sci Eng A,2005

4. Alloys: preparation, properties, applications;Habashi,1998

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Crystal structure, mechanical, electronic, optical and thermoelectric characteristics of Cs2MCl6 (M = Se, Sn, Te and Ti) cubic double perovskites;Results in Physics;2024-01

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