Optical measure of disorder: Why Urbach analysis works for amorphous silicon but fails for amorphous carbon

Author:

Tsu David V.,Schuelke Thomas,Slagter John

Funder

U.S. Department of Energy

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials

Reference39 articles.

1. Diamond-like amorphous carbon;Robertson;Mater. Sci. Eng. R,2002

2. The long-wavelength edge of photographic sensitivity and of the electronic absorption of solids;Franz. Urbach;Phys. Rev.,1953

3. Absorption edge of amorphous As2S3;Kosek;Czechoslov. J. Phys.,1970

4. Optical properties of amorphous semiconductors;Tauc,1974

5. The nature of intermediate range order in Si:F:H(P) alloy system;Tsu;J. Phys. (Paris), Colloq.,1981

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