Characterization of a HPHT boron ion-implanted diamond X-ray mirror following high vacuum annealing-Reference-Cited by-同舟云学术

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Characterization of a HPHT boron ion-implanted diamond X-ray mirror following high vacuum annealing

Published:2024-06 Issue: Volume:146 Page:111212
ISSN:0925-9635
Container-title:Diamond and Related Materials
language:en
Short-container-title:Diamond and Related Materials

Author:

Margraf-O'Neal R.A.^ORCID,Ynsa M.D.^ORCID,Krzywinski J.,Ng M.L.,MacArthur J.P.,Ke F.^ORCID,Zhong Y.^ORCID,Mo S.-K.^ORCID,Pradhan P.^ORCID,Robles R.^ORCID,Robert A.^ORCID,Sato T.,Zhu D.,Halavanau A.^ORCID,Marcus G.^ORCID

Funder

Ministerio de Ciencia e Innovación

España Ministerio de Ciencia e Innovación

U.S. Department of Energy

Laboratory Directed Research and Development

Publisher

Elsevier BV

Reference38 articles.

1. Diamond as an electronic material;Wort;Mater. Today,2008

2. Near-100% Bragg reflectivity of X-rays;Shvyd'ko;Nat. Photonics,2011

3. X-ray server: an online resource for simulations of x-ray diffraction and scattering, Optical Science and Technology;Stepanov,2004

4. Formation of buried p-type conducting layers in diamond;Walker;Appl. Phys. Lett.,1997

5. Formation of delta-doped, buried conducting layers in diamond, by high-energy;Uzan-Saguy;B-ion implantation,1998

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