Comprehensive classification of DLC films formed by various methods using NEXAFS measurement-Reference-Cited by-同舟云学术

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Comprehensive classification of DLC films formed by various methods using NEXAFS measurement

Published:2008-07 Issue:7-10 Volume:17 Page:1743-1745
ISSN:0925-9635
Container-title:Diamond and Related Materials
language:en
Short-container-title:Diamond and Related Materials

Author:

Saikubo Akihiko,Yamada Noriko,Kanda Kazuhiro,Matsui Shinji,Suzuki Tsuneo,Niihara Koichi,Saitoh Hidetoshi

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Interpretation of Raman spectra of disordered and amorphous carbon

2. Local Structures of Carbon Thin Films Synthesized by the Hot Filament Chemical Vapor Deposition Method X-Ray-Absorption Near-Edge Structure and Raman Spectroscopic Studies

3. X-ray absorption spectroscopy study of pulsed-laser-evaporated amorphous carbon films

4. Near-edge x-ray absorption fine structure and Raman characterization of amorphous and nanostructured carbon films

5. Combined near edge X-ray absorption fine structure and X-ray photoemission spectroscopies for the study of amorphous carbon thin films

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