Author:
Ageron M.,Albert A.,Barvich T.,Beaumont W.,Beckers T.,Bernier K.,Blüm P.,Bouhali O.,Boulogne I.,Bouvet D.,Brom J.M.,Charles F.,Coffin J.,Contardo D.,Daubie E.,Didierjean F.,Erdmann M.,De Lentdecker G.,Devroede O.,De Troy J.,Ernenwein J.P.,Fahrer M.,Flügge G.,Fontaine J.C.,Geist W.,Goerlach U.,Gottschalk M.,Helleboid J.M.,Huss D.,Iacopi F.,Kärcher K.,Kühn F.,Juillot P.,Lounis A.,Maazouzi C.,Macke D.,Martin C.,Mirabito L.,Moreau S.,Müller T.,Neuberger D.,Nowack A.,Perries S.,Ripp-Baudot I.,Röderer F.,Schulte R.,Shekhtman L.,Simonis H.J.,Struczinski W.,Tatarinov A.,Thümmel W.H.,Udo F.,Van Doninck W.,Van Dyck C.,Vander Velde C.,Vanlaer P.,Van Lancker L.,Weiler T.,Zander A.,Zghiche A.,Zhukov V.
Subject
Instrumentation,Nuclear and High Energy Physics
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