Summary of thermal, shot and flicker noise in detectors and readout circuits-Reference-Cited by-同舟云学术

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Summary of thermal, shot and flicker noise in detectors and readout circuits

Published:1999-05 Issue:2-3 Volume:426 Page:538-543
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Seller P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. P. Seller, Noise analysis in linear electronic circuits. Nucl. Instr. and Meth. A 376 (1996) 229 Erratum, 408 (1998) 603.

2. P. Seller, RAL-TR-1998-086, January 1999.

3. Noise;Van der Ziel,1970

4. J. Llacer, IEEE Trans. Nucl. Sci. NS-22, (5) (1975).

5. Effect of noise on the resolution of CMOS analog readout systems for microstrip and pixel detectors

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Noise distribution of a peak track and hold circuit;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2012-12

2. Material dependence of bulk leakage current in CdZnTe detectors;SPIE Proceedings;2007-09-13

3. Two approaches to hybrid x-ray pixel array readout;SPIE Proceedings;1999-10-06

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