Author:
Zhou Z.-L.,Širca S.,Boeglin W.,Sarty A.J.,Alarcon R.,Beck R.,Bernstein A.,Bertozzi W.,Botto T.,Bourgeois P.,Calarco J.,Casagrande F.,Chen J.,Comfort J.R.,Dale D.,Distler M.O.,Dodson G.,Dolfini S.,Dooley A.,Dow K.,Epstein M.,Farkhondeh M.,Georgakopoulos S.,Gilad S.,Hicks R.,Holtrop M.,Hotta A.,Jiang X.,Joo K.,Jordan D.,Kaloskamis N.,Karabarbounis A.,Kirkpatrick J.,Kowalski S.,Kunz C.,Liyanage N.,Mandeville J.,Margaziotis D.J.,McIlvain T.,Mertz C.,Milner R.,Miskimen R.,Nakagawa I.,Papanicolas C.N.,Pavan M.,Peterson G.,Ramirez A.,Rowntree D.,Sato Y.,Shaw J.,Six E.,Sobczynski S.,Soong S.-B.,Sparveris N.,Stave S.,Stiliaris S.,Tamae T.,Tieger D.,Tschalær C.,Tsentalovich G.,Turchinetz W.,Vellidis C.,Warren G.A.,Weinstein L.B.,Williamson S.E.,Young A.,Zhao J.,Zwart T.
Subject
Instrumentation,Nuclear and High Energy Physics