Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics-Reference-Cited by-同舟云学术

Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics

Published:2002-08 Issue:1-2 Volume:488 Page:85-93
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Angarano M.M,Beaumont W,Biasini M,Bilei G.M,Brunetti M.T,Checcucci B,Civinini C,Coughlan J,Creanza D,de Palma M,Drouhin F,Fanò L,Fiore L,French M,Furtjes A,Giassi A,Giorgi M,Gutleber J,Hall G,Lariccia P,Loreti M,Maggi G,Mantovani G,Marinelli N,Mattig P,Messina G,My S,Papi A,Radicci V,Raymond M,Santinelli R,Selvaggi G,Servoli L,Silvestris L,Tempesta P,Tsirou A,Verdini P.G,Wittmer B

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

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4. M. Raymond, G. Hall, M. Millmore, M. French, L. Jones, P. Murray, The APV6 readout chip for CMS Microstrip detectors, Proceedings of Third Workshop on Electronics for LHC Experiments, CERN/LHCC/97-60, 1997, 158–162.

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