Laterally resolved measurements of polycrystalline cesium iodide surfaces-Reference-Cited by-同舟云学术

Laterally resolved measurements of polycrystalline cesium iodide surfaces

Published:1997-03 Issue:1-2 Volume:387 Page:163-170
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Rudolf Petra,Marchal F.,Sporken R.,Caudano R.,dell'Orto Tiziana,Almeida J.,Braem A.,Piuz F.,Sgobba S.,Paic G.,Nappi E.,Valentini A.,Sartori P.,Coluzza C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference34 articles.

1. 0.1–10‐keV x‐ray‐induced electron emissions from solids—Models and secondary electron measurements

2. Soft-x-ray-induced secondary-electron emission from semiconductors and insulators: Models and measurements

3. The characterization of x‐ray photocathodes in the 0.1–10‐keV photon energy region

4. Application of a semi‐empirical sputtering model to secondary electron emission

5. The characterisation of soft X-ray photocathodes in the wavelength band 1–300 Å

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