Which part of a CCD pixel is sensitive to the proton damage?-Reference-Cited by-同舟云学术

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Which part of a CCD pixel is sensitive to the proton damage?

Published:2003-10 Issue:1-2 Volume:512 Page:326-331
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Hiraga J.,Tsunemi H.,Miyata E.,Kouno H.,Miyaguchi K.,Matsuta K.,Fukuda M.,Mihara M.,Minamisono T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. Where Are the X-Ray Event Grades Formed Inside the Pixel of the Charge-Coupled Device? The Behavior of the Primary Charge Cloud Inside the Charge-Coupled Device

2. New Technique of the X-Ray Efficiency Measurement of a Charge-Coupled Device with a Subpixel Resolution

3. Direct measurements at the sub-pixel level of the X-ray detection efficiency of the CCD on board the ASCA satellite

4. Direct measurement of sub-pixel structure of the EPIC MOS CCD on-board the XMM/NEWTON satellite

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Detection of atomic and molecular mega-electron-volt projectiles using an x-ray charged coupled device camera;Review of Scientific Instruments;2011-10

2. Application of a mesh experiment for a proton beam onto the charge-coupled device;IEEE Transactions on Nuclear Science;2004-10

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