X-ray imaging and spectroscopy with Controlled-Drift Detectors: experimental results and perspectives
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference9 articles.
1. EP0862226, US Patent: US 6,249,033.
2. Conception and design criteria of a novel silicon device for the measurement of position and energy of X-rays
3. The controlled-drift detector
4. Spectroscopic-grade X-ray imaging up to 100-kHz frame rate with controlled-drift detectors
5. A. Castoldi, G. Cattaneo, A. Galimberti, C. Guazzoni, P. Rehak, L. Strüder, IEEE Trans. Nucl. Sci. NS-49 (2002).
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