1. G. Krampl, M. Rona, K. Einwich, Model and simulator coupling for virtual test, Proceedings of the Sixth IEEE International Mixed-Signal Testing Workshop, Montpellier, France, 2000, pp. 175–179.
2. K. Einwich, G. Krampl, R. Hoppenstock, S. Sattler, S. Altmann, T. Leitner, Applying high level virtual test to a complex mixed-signal telecommunication circuit, Proceedings of the 5th International Mixed-Signal Testing Workshop, Whistler, BC, Canada, June 1999, pp. 91–95.
3. K. Einwich, P. Schwarz, P. Trappe, T. Chambers, G. Krampl, H. Zojer, S. Sattler, Virtual test of complex mixed-signal telecommunication circuits reusing system level models, Proceedings of the Fourth IEEE International Mixed-Signal Testing Workshop, The Hague, The Netherlands, 1998, pp. 237–242.
4. T. Austin, Creating a mixed signal simulation capability for concurrent IC design and test program development, Proceedings of the IEEE International Test Conference, Washington 1993, pp. 125–132.
5. B. Webster, An integrated analogue test simulation environment, Proceedings of the IEEE International Test Conference, 1989, pp. 567–571.