Four different approaches for the measurement of IC surface temperature: application to thermal testing-Reference-Cited by-同舟云学术

Four different approaches for the measurement of IC surface temperature: application to thermal testing

Published:2002-09 Issue:9 Volume:33 Page:689-696
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Altet Josep,Dilhaire Stefan,Volz Sebastian,Rampnoux Jean-Michel,Rubio Antonio,Grauby Stephane,Patino Lopez Luis David,Claeys Wilfrid,Saulnier Jean-Bernard

Publisher

Elsevier BV

Subject

General Engineering

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