SEM/EDX analyses of some interactions between thick film resistors and dielectrics-Reference-Cited by-同舟云学术

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SEM/EDX analyses of some interactions between thick film resistors and dielectrics

Published:1984-03 Issue:2 Volume:15 Page:38-43
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Adie George,Holodnik Barbara,Pitt Keith

Publisher

Elsevier BV

Subject

General Engineering

Reference3 articles.

1. The Properties of Thick Film Resistors on Dielectrics;Joshi;Microelectronics Journal,1982

2. Coleman, M. V.: Private Communication.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thick-film resistor/dielectric interactions in a low temperature co-fired ceramic package;IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B;1995-05

2. Physicochemical investigations and nonstandard electrical measurements of inks and thick films—Bibliography;Microelectronics Reliability;1991-01

3. Further studies of the interactions between thick film resistors and dielectrics;Microelectronics Journal;1987-01

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