A new evaluation method of thermal transient measurement results-Reference-Cited by-同舟云学术

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A new evaluation method of thermal transient measurement results

Published:1997-03 Issue:3 Volume:28 Page:277-292
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Székely V.

Publisher

Elsevier BV

Subject

General Engineering

Reference16 articles.

1. Electrical Characteristics of Transistors;Pritchard,1967

2. Transient thermal impedance of semiconductor devices;Diebold;AIEE Trans. J.,1961

3. Transient thermal analysis of solid-state power devices — making a dreaded process easy;Newell;PESC 1975 Record,1975

4. Analysis of thermal transient data with synthesized dynamic models for semiconductor devices;Sofia,1994

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