Simulated fault injection methodology for gate-level quantum circuit reliability assessment

Author:

Udrescu Mihai,Prodan Lucian,Vlăduţiu Mircea

Publisher

Elsevier BV

Subject

Hardware and Architecture,Modelling and Simulation,Software

Reference28 articles.

1. D. Aharonov, M. Ben-Or, Fault-Tolerant Quantum Computation with Constant Error Rate, 1999 (quant-ph/9906129v1).

2. P. Aliferis, D. Gotesman, J. Preskill, Accuracy Threshold for Postselected Quantum Computation, 2007. arXiv:quant-ph/0703264.

3. Elementary gates for quantum computation;Barenco;Phys. Rev. A,1995

4. O. Boncalo, M. Udrescu, L. Prodan, M. Vladutiu, A. Amaricai, Using simulated fault injection for fault tolerance assessment of quantum circuits, in: Proceedings 40th IEEE Annual Simulation Symposium, 2007, pp. 213–220.

5. O. Boncalo. Simulation Based Reliability Assessment of Quantum Circuits, PhD Thesis, University Politehnica of Timişoara, 2008.

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