Subject
General Materials Science
Reference37 articles.
1. The future of atom probe tomography;Miller;Mater Today,2012
2. Atomic-scale tomography: a 2020 vision;Kelly;Microsc Microanal,2013
3. Panayi P. Curved reflectron. USA Patent UK 0509638.3 and US 60/682,863.
4. Atom probe field ion microscopy;Miller,1996
5. The atom probe and Markov chain statistics of clustering;Johnson;Technometrics,1974
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献