Atom probe tomography of nanoscale architectures in functional materials for electronic and photonic applications-Reference-Cited by-同舟云学术

Atom probe tomography of nanoscale architectures in functional materials for electronic and photonic applications

Published:2018-10 Issue:5 Volume:22 Page:171-187
ISSN:1359-0286
Container-title:Current Opinion in Solid State and Materials Science
language:en
Short-container-title:Current Opinion in Solid State and Materials Science

Author:

Chang Alexander S.,Lauhon Lincoln J.

Funder

National Science Foundation and the Advanced Research Projects Agency-Energy

Publisher

Elsevier BV

Subject

General Materials Science

Reference168 articles.

1. D. Blavette, F. Vurpillot, B. Deconihout, A. Menand, Atom probe tomography: 3D imaging at the atomic level, in: F.A. Lasagni, A.F. Lasagni (Eds.), Fabrication and Characterization in the Micro-Nano Range: New Trends for Two and Three Dimensional Structures, Springer, Berlin, Vol. 10, 2011, pp. 201–222.

2. An Atom-Probe Tomography Primer

3. Electron Tomography: A Three-Dimensional Analytic Tool for Hard and Soft Materials Research

4. Nanoscale tomography in materials science

5. T.F. Kelly, D.J. Larson, Atom Probe Tomography 2012 in: D.R. Clarke (Ed.), Annual Review of Materials Research, Annual Reviews, Palo Alto, Vol 42, 2012, Vol. 42, pp 1-31.

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