Influences of ion migration and electric field on the layered anodic films on Al–Mg alloys
Author:
Publisher
Elsevier BV
Subject
General Materials Science,General Chemical Engineering,General Chemistry
Reference18 articles.
1. Effects of Alloying Elements in Anodizing of Aluminium
2. Film formation and detachment during anodizing of Al–Mg alloys
3. Elastic recoil detection analysis (ERDA), RBS and TEM study of barrier film formation on Al-4.5 at.% Mg-0.05 at.% Cu alloy
4. Anodic film growth on an Al–21at.%Mg alloy
5. The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l
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