Fault tolerant adaptive write schemes for improving endurance and reliability of memristor memories

Author:

Ravi V.,Prabaharan S.R.S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering

Reference73 articles.

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4. The end of CMOS scaling: toward the introduction of new materials and structural changes to improve MOSFET performance;Skotnicki;IEEE Circuits Devices Mag,2005

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