Roughness distribution of multiple hit and long surface diffusion length noise reduced discrete growth models-Reference-Cited by-同舟云学术

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Roughness distribution of multiple hit and long surface diffusion length noise reduced discrete growth models

Published:2016-11 Issue: Volume:462 Page:619-629
ISSN:0378-4371
Container-title:Physica A: Statistical Mechanics and its Applications
language:en
Short-container-title:Physica A: Statistical Mechanics and its Applications

Author:

Disrattakit P.,Chanphana R.,Chatraphorn P.

Funder

Research Center in Thin Film Physics

Thailand Center of Excellence in Physics

Ratchadapiseksomphot Endowment under Outstanding Research Performance Program

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Statistics and Probability

Reference33 articles.

1. Width distribution for (2+1)-dimensional growth and deposition processes;Rácz;Phys. Rev. E,1994

2. Width distribution of curvature-driven interfaces: A study of universality;Plischke;Phys. Rev. E,1994

3. Numerical study of roughness distributions in nonlinear models of interface growth;Reis;Phys. Rev. E,2005

4. Dynamic scaling in thin-film growth with irreversible step-edge attachment;Aarão Reis;Phys. Rev. E,2010

5. Height and roughness distributions in thin films with Kardar–Parisi–Zhang scaling;Paiva;Surf. Sci.,2007

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